Document Type
Thesis
Date of Award
5-31-1988
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
Mauro Zambuto
Abstract
This study has determined the failure mechanisms of solid tantalum capacitors and their causes. It was observed that high leakage current and electric shorts are the most prominant modes of failure. The experimental data has proved that humidity and high temperature are the factors which promote these kinds of failures. It is also stablished that change in electrical parameters due to exposure to harsh weather are reversible. Vacuum treatment to such capacitors helped in improving their electrical characteristics.
Recommended Citation
Kazmi, Syed R., "Failure mechanisms of hermetically sealed solid tantalum capacitors" (1988). Theses. 3113.
https://digitalcommons.njit.edu/theses/3113
