Document Type
Thesis
Date of Award
8-31-1986
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
S. Pandey
Second Advisor
Raj Pratap Misra
Third Advisor
W. H. Warren Ball
Abstract
The aim of this thesis is to develop a screening method to predict the reliability of a dielectric material. The screen chosen is an electrical noise. The dielectric material studied is varnished fibre glass cloth material supplied by Westinghouse Electric Corporation.
The dielectric material will have varying amount of voids, crystal defects, and surface contaminants impurities introduced during manufacturing process. On application of the electric stress, ionization (corona) will take place. The corona degrades the material due to thermally generated heat, chemical reactions in the voids and ionic bombardment of the material.
An experimental set up is developed to monitor the electrical noise generated in the bulk of the specimen. An assembly is deviced to ensure as far as possible flatness and uniform mechanical pressure measurements. The readings are analyzed statistically. The coefficient of correlation between the noise and breakdown voltage indicates a small amount of correlation, but it is hoped that there may be a significant amount of correlation if specimens are put for an extended (accelerated) life test under a combination of an elevated temperature and the voltage.
Recommended Citation
Jain, Ramesh K., "Reliability of dielectrics : using noise as a diagnostic tool" (1986). Theses. 3411.
https://digitalcommons.njit.edu/theses/3411
