Document Type
Thesis
Date of Award
5-31-1988
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
S. Pandey
Abstract
The stability and reliability of semiconductor laser is dependent on its design, fabrication, and output power. The best way to assure high reliability of these devices is by accelerated aging test and by selection of strict and meaningful criteria for the acceptance or rejection of a particular device. In this thesis emphasis is given on different failure mechanisms that are known. As new development takes place, other mechanisms may be found. Catastrophic degradation, gradual degradation, darkline defects, and contamination during the fabrication process are the main source of device failure.
The noise generation and the packaging issue of semiconductor laser are explained in detail. Noise generated due to the temperature variation and to the optical feedback deteriorates almost all operating characteristics of the laser. Radiation environment causes catastrophic failure. The detailed study of all these aspects is included in this report. It is concluded that the semiconductor laser reliability is a very important factor in the technical success of any system using the device.
Recommended Citation
Patel, Ajay R., "Reliability problems in semiconductor lasers" (1988). Theses. 3162.
https://digitalcommons.njit.edu/theses/3162
