Near-field microscope probe for far infrared time domain measurements
Document Type
Article
Publication Date
7-24-2000
Abstract
A near-field probe fabrication technique for far-infrared frequencies based on photoconducting antennas is developed. A subwavelength-size field source is accomplished by means of an aperture and protruding high refractive index tip. The near-field probe is tested by using free space traveling electromagnetic pulses with a broadband spectrum in the range of 0.3-1.5 THz. A spatial resolution of 60 μm is achieved for a 50 μm aperture. The described probe may be used for near-field transmission microscopy in illumination and collection modes. Resolution may be further improved by means of a smaller aperture. © 2000 American Institute of Physics. [S0003-6951(00)04630-1].
Identifier
0001493379 (Scopus)
Publication Title
Applied Physics Letters
External Full Text Location
https://doi.org/10.1063/1.127054
ISSN
00036951
First Page
591
Last Page
593
Issue
4
Volume
77
Recommended Citation
Mitrofanov, O.; Brener, I.; Wanke, M. C.; Ruel, R. R.; Wynn, J. D.; Bruce, A. J.; and Federici, J., "Near-field microscope probe for far infrared time domain measurements" (2000). Faculty Publications. 15572.
https://digitalcommons.njit.edu/fac_pubs/15572