Terahertz near-field microscopy based on a collection mode detector

Authors

O. Mitrofanov, New Jersey Institute of Technology
I. Brener, Nokia Bell Labs
R. Harel, Nokia Bell Labs
J. D. Wynn, Nokia Bell Labs
L. N. Pfeiffer, Nokia Bell Labs
K. W. West, Nokia Bell Labs
J. Federici, New Jersey Institute of Technology

Document Type

Article

Publication Date

11-27-2000

Abstract

We report on the development of a collection mode near-field probe for the terahertz spectral range. The near-field detector is based on an aperture type probe with dimensions of 30×30 μm² The collection mode technique provides higher sensitivity and higher resolution than the similar illumination mode approach. Spatial resolution better than 40 μm is demonstrated for a broad spectrum of 300-600 μm, which equals to λ/15 for the longest wavelength. The observed resolution is determined by the size of the probe aperture. © 2000 American Institute of Physics.

Identifier

0000465053 (Scopus)

Publication Title

Applied Physics Letters

External Full Text Location

https://doi.org/10.1063/1.1328772

ISSN

00036951

First Page

3496

Last Page

3498

Issue

22

Volume

77

Recommended Citation

Mitrofanov, O.; Brener, I.; Harel, R.; Wynn, J. D.; Pfeiffer, L. N.; West, K. W.; and Federici, J., "Terahertz near-field microscopy based on a collection mode detector" (2000). Faculty Publications. 15526.
https://digitalcommons.njit.edu/fac_pubs/15526