Document Type
Thesis
Date of Award
9-30-1984
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
Mauro Zambuto
Third Advisor
W. H. Warren Ball
Abstract
The purpose of this project is to study screening of components from the reliability point of view. The component used is electronic transformer. The screen chosen is Electrical Noise generated in the transformer insulation system and the failure mode selected is leakage current in the transformer insulation.
Experiments were conducted to monitor electrical noise generated due to partial ionization of the tiny air gaps in the transformer insulation. The voltage stress, regiured to be applied to the insulation system, for constant 59 units of noise, recorded for the sample of three hundred seventeen transformers.
The voltage readings were analyzed statiscally and were found to have a normal distribution.
Fifteen units which gave high voltage readings and forteen units which gave low voltage readings were subjected to accelerated life tests and the data is used to calculate the coefficient of correlation.
Recommended Citation
Shah, Bharat M., "Reliability screening of transformers" (1984). Theses. 3610.
https://digitalcommons.njit.edu/theses/3610
