Document Type
Thesis
Date of Award
5-31-1986
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
S. Pandey
Third Advisor
W. H. Warren Ball
Abstract
The purpose of this thesis is to study the reliability of liquid crystal display under different temperature conditions. To accomplish this, accelerated life testing was done on the soft glass and the hard glass liquid crystal display units at 77 C and 85 C temperature without any added humidity or voltage.
As the current is a usefu1 indicator for probable wear of liquid crystal display, leakage current was measured at 0 hour, 1000 hours, 2000 hours and 3000 hours when the units have stabilized at room temperature.
The date shows higher spread for the hard glass units. This may indicate non maturity of manufacture of the hard glass since they were custom made for us. And There is a smaller change in leakege current at higher temperature. This discrepancy of smaller change is quite unexpected. Therefore, the test must be continued to understand what is going on.
Recommended Citation
Desai, Kalpesh Mahendra, "Reliability study of liquid crystal display" (1986). Theses. 3489.
https://digitalcommons.njit.edu/theses/3489
