Document Type
Thesis
Date of Award
5-31-1985
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
S. Pandey
Third Advisor
W. H. Warren Ball
Abstract
Today, reliability is acknowledged as an important item in design and the operation of the electronic systems.
This thesis provides some theory, and experiments are instituted to evaluate the reliability for SOLID TANTALUM CAPACITORS made by different manufacturers. The experimental life test work was done at high temperature of 9S 2°C and high humidity of 95 ± 3% on transfer molded tantalum capacitors.
Literature study concentrates on the reliability in solid tantalum capacitors developed between 1961 and 1984.
Several failure mechanisms with figures are illustrated to point out how higher reliability of solid tantalum capacitors may be developed.
The bibliography is given extensively, in chronoloclical order, so that an up-to-date reference list can be available to anyone wishing to do further research on this topic.
Recommended Citation
Nakrani, Ghanshyam B., "Reliability problems and failure mechanisms of solid tantalum capacitors" (1985). Theses. 3458.
https://digitalcommons.njit.edu/theses/3458
