Document Type
Thesis
Date of Award
9-30-1985
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
S. Pandey
Third Advisor
Robert R. Meola
Abstract
This study has determined the effects of high temperature and humidity on the reliability of liquid crystal dis-plays.
Reliability life testing was done on variety of LCD samples under different operating conditions. All the besting was done under accelerated conditions, including high temperature of 85°C and relative humidity of 70%. A number of failure modes were identified in the long series'of tests.
Among many failure modes such as peeling of seal, degradation of polarizers etc., the most important is the degradation of alignment of liquid crystal molecules. Leakage current measurements were made on all the LCD samples before and after subjecting to the environmental stress conditions; since the current is a useful indicator for the probable wear of the liquid crystal displays. The increase in current of the samples, indicates a degradation of alignment of liquid crystal molecules, causing an irregularity in the optical properties of display and this should be considered a failure of the LCD.
Recommended Citation
Kalyandrug, Ravi Sankar, "Reliability evaluation of liquid crystal displays under accelerated test conditions" (1985). Theses. 3442.
https://digitalcommons.njit.edu/theses/3442
