Document Type
Thesis
Date of Award
1-31-1985
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
S. Pandey
Third Advisor
W. H. Warren Ball
Abstract
This study has determined the effect of high humidity and temperature on solid tantalum capacitors, from five different sources.
The reasons for using capacitors from five different prestigious sources is to first determine how the parameters change with the different manufacturing techniques used by the different sources. Secondly to rank the different sources according to reliability. The parameters that were measured before and after the "1000 hour" high temperature and humidity test were, capacitance, leakage current, and equivalent series resistance. All the capacitors showed significant increase in leakage current after the test, but there were wide variations in catastrophic failure rates between different manufacturers. The names of these manufacturers have not been disclosed in order to safeguard their commercial interests.
Recommended Citation
Grant, Joseph G., "Failure rates and leakage current increase in tantalum capacitors of different manufacturers" (1985). Theses. 3427.
https://digitalcommons.njit.edu/theses/3427
