Modeling and investigation of current transport phenomena in schottky structures

Author

Yan Zeng, New Jersey Institute of Technology

Document Type

Thesis

Date of Award

5-31-1993

Degree Name

Master of Science in Electrical Engineering - (M.S.)

Department

Electrical and Computer Engineering

First Advisor

N. M. Ravindra

Second Advisor

Durgamadhab Misra

Third Advisor

Haim Grebel

Abstract

We have used a numerical method to describe the importance of the contribution of generation-recombination current to the I-V characteristics of Schottky barrier contacts. The current-voltage relationship is derived directly from the fundamental set of equations such as Poisson; current-density and continuity equations, without having to make many simplifications or approximations. The final result includes not only the thermionic emission or drift diffusion mechanisms of current flow, but also the generation recombination processes.

The experimental devices used for this work are very common low barrier height Schottky structures, Al/T_0.3W_0.7/n-Si/A1 and Ti_0.3W_0.7/n-Si/Al. The comparison between the measured and simulated results strongly showed the effect of recombination current as an important factor for even relatively low barrier height devices in the low bias region. From derived expression of the I-V characteristics, we can accurately fit the experimental results just simply by adding the term for the recombination effects. A good estimation for the values of recombination current effect can be calculated from I-V expression used for this work.

Recommended Citation

Zeng, Yan, "Modeling and investigation of current transport phenomena in schottky structures" (1993). Theses. 2215.
https://digitalcommons.njit.edu/theses/2215