Document Type
Thesis
Date of Award
Fall 1-31-1995
Degree Name
Master of Science in Applied Physics - (M.S.)
Department
Physics
First Advisor
Kenneth Rudolph Farmer
Second Advisor
Ken K. Chin
Third Advisor
William N. Carr
Abstract
In this thesis the history and recent developments on the silicon direct bonding technique are reviewed. The growing applications of this technique in SOI, SOS and MEMS areas, difficulties and disadvantages of various bonding processes are discussed. A direct bonding procedure for attaching ultra-thin wafers less than 200 μm thick to substrate wafers is developed and described in detail. Difficulties in handling, aligning and annealing ultra-thin wafers are reported. Wafers of different doping concentration, thickness, surface roughness and chemical characteristics are tested for bondability. Methods to minimize voids and other failure mechanisms are proposed. A photodetector is designed based on ultra-thin wafer bonding. The essential fabrication details of this detector are carried out to demonstrate the feasibility of using ultra-thin silicon wafer bonding to make an optically sensitive device.
Recommended Citation
Yan, Diyu, "Ultra-thin silicon wafer bonding" (1995). Theses. 1205.
https://digitalcommons.njit.edu/theses/1205
