Nitrogen doped ZnO (ZnO:N) thin films deposited by reactive RF agnetron sputtering for PEC applications
Document Type
Conference Proceeding
Publication Date
1-1-2012
Abstract
ZnO:N films were deposited by reactive RF magnetron sputtering on F-doped tin oxide coated glass substrates in mixed N2 and O2 gas ambient. Their PEC properties were measured and compared with those of as-deposited and annealed ZnO films. The ZnO:N films exhibit photoresponse in the visible-light region, yielding higher total photocurrents than ZnO thin films. ZnO:N thin films with reduced bandgaps were synthesized by reactive RF magnetron sputtering using ZnO target at 100°C followed by post deposition annealing at 500°C in air for 2 h. ZnO:N thin films showed enhanced N incorporation and shift of the optical absorption into the visible light regions. As a result, ZnO:N films showed improved PEC response, compared to ZnO thin films.
Identifier
84860842869 (Scopus)
ISBN
[9781118296073]
Publication Title
TMS Annual Meeting
First Page
669
Last Page
676
Volume
1
Recommended Citation
Shet, Sudhakar; Ahn, Kwang Soon; Ravindra, Nuggehalli; Yan, Yanfa; and Al-Jassim, Mowafak, "Nitrogen doped ZnO (ZnO:N) thin films deposited by reactive RF agnetron sputtering for PEC applications" (2012). Faculty Publications. 18473.
https://digitalcommons.njit.edu/fac_pubs/18473
