Distributed generation of weighted random patterns

Document Type

Article

Publication Date

12-1-1999

Abstract

This paper describes the design details, operation, cost, and performance of a distributed weighted pattern test approach at the chip level. The traditional LSSD SRLs are being replaced by WRP SRLs designed specifically to facilitate a weighted random pattern (WRP) test. A two-bit code is transmitted to each WRP SRL to determine its specific weight. The WRP test is then divided into groups, where each group is activated with a different set of weights. The weights are dynamically adjusted during the course of the test to `go after' the remaining untested faults. The cost and performance of this design system are explored on ten pilot chips. Results of this experiment are provided in the paper.

Identifier

0033327428 (Scopus)

Publication Title

IEEE Transactions on Computers

External Full Text Location

https://doi.org/10.1109/12.817399

ISSN

00189340

First Page

1364

Last Page

1368

Issue

12

Volume

48

Fund Ref

State of New Jersey Commission on Science and Technology

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