On the detectability of parametric faults in analog circuits

Authors

Jacob Savir, Newark College of Engineering
Zhen Guo, Newark College of Engineering

Document Type

Conference Proceeding

Publication Date

1-1-2002

Abstract

This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.

Identifier

0036397197 (Scopus)

Publication Title

Proceedings IEEE International Conference on Computer Design VLSI in Computers and Processors

First Page

273

Last Page

276

Recommended Citation

Savir, Jacob and Guo, Zhen, "On the detectability of parametric faults in analog circuits" (2002). Faculty Publications. 14881.
https://digitalcommons.njit.edu/fac_pubs/14881