Test limitations of parametric faults in analog circuits

Document Type

Conference Proceeding

Publication Date

1-1-2002

Abstract

This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.

Identifier

0038697647 (Scopus)

ISBN

[0769518257]

Publication Title

Proceedings of the Asian Test Symposium

External Full Text Location

https://doi.org/10.1109/ATS.2002.1181682

ISSN

10817735

First Page

39

Last Page

44

Volume

2002-January

This document is currently not available here.

Share

COinS