Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers
Document Type
Conference Proceeding
Publication Date
12-1-2011
Abstract
We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed. © 2011 IEEE.
Identifier
84861078331 (Scopus)
ISBN
[9781424499656]
Publication Title
Conference Record of the IEEE Photovoltaic Specialists Conference
External Full Text Location
https://doi.org/10.1109/PVSC.2011.6186272
ISSN
01608371
First Page
001647
Last Page
001651
Recommended Citation
Devayajanam, S.; Rupnowski, P.; Shet, S.; Sopori, B. L.; Ravindra, N. M.; Caskey, D.; Chang, J.; and Covington, J., "Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers" (2011). Faculty Publications. 11034.
https://digitalcommons.njit.edu/fac_pubs/11034
