Document Type
Thesis
Date of Award
9-30-1985
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
S. Pandey
Third Advisor
W. H. Warren Ball
Abstract
The purpose of this Thesis is to study the life of liquid crystal display devices as at present available in the market place. To accomplish this, accelerated tempera-ture conditions at 77°C and 85°C were used.
During the last few years, there has grown a tremendous interest in wide range temperature operating and fast LCDs. It is therefore important to understand how LCDs behave under these conditions.
The reliability of a liquid crystal display is usually measured in terms of a quantative degradation in electrical performance and a degradation in visual appearance. The degradation in visual appear6knce may manifest itself as a misalignment of fluid molecules, resulting in blemishes or exhibiting an 'on' appearance when not biased or lowering the clarity.
A substantial increase in the current drawn by the LCDs or a short circuit between the display segments is considered as a failure of the device.
Recommended Citation
Suresh, C. N., "Present reliability of liquid crystal display devices" (1985). Theses. 3478.
https://digitalcommons.njit.edu/theses/3478
