Document Type
Thesis
Date of Award
5-31-1987
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
S. Pandey
Abstract
Today, reliability is acknowledged as an important item in design and operation of the electronic systems.
This thesis provides some theory, and experiments are instituted to evaluate the reliability of SOLID TANTALUM CAPACITORS made by reputed manufacturers. The experiment was conducted on four batches of tantalum capacitors at different temperatures at different humidity levels. One chapter is on different manufacturing techniques presently applied.
Literature study concentrates on the reliability in solid tantalum capacitors developed between 1961 and 1986.
Several failure mechanism with figure are illustrated to point out how higher reliability of solid tantalum capacitor may be developed.
The bibliography is given extensively, in chronological order, so that an up to date reference can be available to anyone wishing to do further research on this topic.
Recommended Citation
Bhatt, Rajan N., "Study of reliability and failure mechanism of solid tantalum capacitor" (1987). Theses. 3048.
https://digitalcommons.njit.edu/theses/3048
