Document Type
Thesis
Date of Award
Fall 10-31-1994
Degree Name
Master of Science in Applied Physics - (M.S.)
Department
Physics
First Advisor
Ken K. Chin
Second Advisor
John Charles Hensel
Third Advisor
Yuan Yan
Abstract
Hall effect measurement in the electrical characterization of semiconductor materials is very important. We set up the Hall effect measurement system and examined the system with a standard sample. The experimental results show that this Hall measurement system worked as well as expected. We also used this system to study the GaAs/GaAs and InGaAs/GaAs which grown by MBE. Finally, we disscussed and consided some common problems of Hall measurement. Some useful formulas and plots are presented.
Recommended Citation
Luo, Hong-Sheng, "Measurement of the Hall coefficient and electron mobility using Van Der Pauw type Hall effect measurements" (1994). Theses. 1645.
https://digitalcommons.njit.edu/theses/1645
