Date of Award

Fall 1994

Document Type

Thesis

Degree Name

Master of Science in Applied Physics - (M.S.)

Department

Physics

First Advisor

Chin, Ken K.

Second Advisor

Hensel, John Charles

Third Advisor

Yan, Yuan

Abstract

Hall effect measurement in the electrical characterization of semiconductor materials is very important. We set up the Hall effect measurement system and examined the system with a standard sample. The experimental results show that this Hall measurement system worked as well as expected. We also used this system to study the GaAs/GaAs and InGaAs/GaAs which grown by MBE. Finally, we disscussed and consided some common problems of Hall measurement. Some useful formulas and plots are presented.

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