Document Type


Date of Award

Fall 10-31-1994

Degree Name

Master of Science in Applied Physics - (M.S.)



First Advisor

Ken K. Chin

Second Advisor

John Charles Hensel

Third Advisor

Yuan Yan


Hall effect measurement in the electrical characterization of semiconductor materials is very important. We set up the Hall effect measurement system and examined the system with a standard sample. The experimental results show that this Hall measurement system worked as well as expected. We also used this system to study the GaAs/GaAs and InGaAs/GaAs which grown by MBE. Finally, we disscussed and consided some common problems of Hall measurement. Some useful formulas and plots are presented.

Included in

Other Physics Commons



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