Document Type
Thesis
Date of Award
Spring 5-31-1986
Degree Name
Master of Science in Electrical Engineering - (M.S.)
Department
Electrical Engineering
First Advisor
Raj Pratap Misra
Second Advisor
Mauro Zambuto
Abstract
The purpose of this thesis is to understand the failure mechanisms in Solid Tantalum Capacitors encapsulated in plastic, and to suggest the precautionary measures that prevent the occurrence of these failures.
The reliability of Solid Tantalum Capacitors encapsulated in plastic is of considerable interest because in some applications where the mechanical accelerations or shocks are considerable the "better" "hermitically" sealed type are not able to sustain themselves. Poor adherence between the dielectric film and the base metal Tantalum under the conditions of sudden mechanical shocks, causes problems.
Our study was carried out in two different directions, theoretical and experimental. The theoretical part is comprehensive review of the work done on Tantalum Capacitors from 1960 to upto date.
The experimental part of the study is done by means of accelerated life testing under the conditions of high humidity & high temperature as well as various high temperatures without added humidity.
Recommended Citation
Golthi, Venkata R., "Reliability studies on solid tantalum electrolytic capacitors by means of accelerated life tests" (1986). Theses. 1447.
https://digitalcommons.njit.edu/theses/1447
