Document Type


Date of Award

Spring 5-31-1986

Degree Name

Master of Science in Electrical Engineering - (M.S.)


Electrical Engineering

First Advisor

Raj Pratap Misra

Second Advisor

Mauro Zambuto


The purpose of this thesis is to understand the failure mechanisms in Solid Tantalum Capacitors encapsulated in plastic, and to suggest the precautionary measures that prevent the occurrence of these failures.

The reliability of Solid Tantalum Capacitors encapsulated in plastic is of considerable interest because in some applications where the mechanical accelerations or shocks are considerable the "better" "hermitically" sealed type are not able to sustain themselves. Poor adherence between the dielectric film and the base metal Tantalum under the conditions of sudden mechanical shocks, causes problems.

Our study was carried out in two different directions, theoretical and experimental. The theoretical part is comprehensive review of the work done on Tantalum Capacitors from 1960 to upto date.

The experimental part of the study is done by means of accelerated life testing under the conditions of high humidity & high temperature as well as various high temperatures without added humidity.



To view the content in your browser, please download Adobe Reader or, alternately,
you may Download the file to your hard drive.

NOTE: The latest versions of Adobe Reader do not support viewing PDF files within Firefox on Mac OS and if you are using a modern (Intel) Mac, there is no official plugin for viewing PDF files within the browser window.