Response Policies to Process Module Failure in Single-Arm Cluster Tools Subject to Wafer Residency Time Constraints
Document Type
Conference Proceeding
Publication Date
7-1-2015
Abstract
In semiconductor manufacturing, wafer residency time constraints make the scheduling problem of cluster tools complicated. A process module (PM) in cluster tools is prone to failure. It is crucial to deal with any such failure in a proper and timely manner. If there are feasible periodic schedules in operating a cluster tool before and after a PM failure, it is desired to make it operate continuously when such a failure occurs. However, due to wafer residency time constraints, it is highly challenging to control a tool such that it can be correctly transferred from a feasible schedule before failure to another after it. To solve this problem, a Petri net model is developed to describe the dynamic behavior of a single-arm cluster tool and failure response policies are proposed. The proposed policies are formulated via simple control laws for their easy implementation. Examples are given to show them.
Identifier
85027922358 (Scopus)
Publication Title
IEEE Transactions on Automation Science and Engineering
External Full Text Location
https://doi.org/10.1109/TASE.2014.2312823
ISSN
15455955
First Page
1125
Last Page
1139
Issue
3
Volume
12
Recommended Citation
Qiao, Yan; Pan, Chun Rong; Wu, Nai Qi; and Zhou, Mengchu, "Response Policies to Process Module Failure in Single-Arm Cluster Tools Subject to Wafer Residency Time Constraints" (2015). Faculty Publications. 6930.
https://digitalcommons.njit.edu/fac_pubs/6930
