Synthesis and characterization of plasma assisted chemically vapor deposited tantalum
Document Type
Article
Publication Date
7-30-2010
Abstract
This study focuses on the synthesis of tantalum (Ta) coatings on high strength steel by plasma assisted chemical vapor deposition using tantalum pentachloride (TaCl5) as a preferred precursor and hydrogen (H 2) as a reducing agent. The interrelationships governing the growth kinetics, compositions, and coating properties are discussed as a function of deposition temperature, total pressure, and gas composition. The synthesized tantalum coatings are shown to be essentially pure with trace amounts of oxygen, carbon, and chlorine. The coatings are found to be dense and to exhibit conformal coverage. Preferential formation of the α-Ta phase is noted to occur when coatings are grown sequentially and in-situ on a TaNx seed layer. © 2010 Elsevier B.V.
Identifier
77955654187 (Scopus)
Publication Title
Thin Solid Films
External Full Text Location
https://doi.org/10.1016/j.tsf.2010.04.014
ISSN
00406090
First Page
5452
Last Page
5456
Issue
19
Volume
518
Recommended Citation
Suh, Y.; Chen, W.; Maeng, S.; Gu, S.; Levy, R. A.; and Thridandam, H., "Synthesis and characterization of plasma assisted chemically vapor deposited tantalum" (2010). Faculty Publications. 6191.
https://digitalcommons.njit.edu/fac_pubs/6191