Physical imaging of void using ultrafast light in optical precision

Document Type

Conference Proceeding

Publication Date

5-27-2005

Abstract

This article shows the applications of ultrafast light in studying material optical properties and its application for rudimental imaging. Standard methods, when applied to the imaging, can not independently determine the material's thickness and index of refraction. The proposed method is fundamentally different from other imaging such as contrast difference in optical coherent tomography (OCT) or the peak-to-peak intensity ratio as in THz imaging to determine index of refraction and thickness. We show that the application of ultrafast techniques allows simultaneous measurements of material thickness and optical constants in optical precision from transmission measurements. Such finding invites new perspectives in imaging and other applicable disciplines.

Identifier

18744404273 (Scopus)

Publication Title

Proceedings of SPIE the International Society for Optical Engineering

External Full Text Location

https://doi.org/10.1117/12.583393

ISSN

0277786X

First Page

411

Last Page

420

Volume

5647

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