High-efficiency high-energy-resolution spectrometer for inelastic X-ray scattering

Document Type

Conference Proceeding

Publication Date

12-1-2005

Abstract

A nine-element analyzer system for inelastic X-ray scattering has been designed and constructed. Each individual analyzer crystal is carefully aligned with an inverse joystick goniometer. For the analyzers silicon wafers with 100 mm diameter are spherically bent to 1 or 0.85 m radius, respectively. Additionally, an analyzer with an extra small radius of 0.182 m and diameter of 100 mm was constructed for X-ray absorption spectroscopy in fluorescence mode. All analyzer crystals with large radius have highly uniform focusing property. The total energy resolution is approximately 0.5 eV at backscattering for the 1 m radius Si(440) analyzer array and approximately 4 eV for the 0.182 m radius Si(440) analyzer at 6493 eV. © 2005 Elsevier Ltd. All rights reserved.

Identifier

29144502206 (Scopus)

Publication Title

Journal of Physics and Chemistry of Solids

External Full Text Location

https://doi.org/10.1016/j.jpcs.2005.09.069

ISSN

00223697

First Page

2295

Last Page

2298

Issue

12

Volume

66

Grant

DMR-0216858

Fund Ref

U.S. Department of Energy

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