Coefficient-based test of parametric faults in analog circuits
Document Type
Article
Publication Date
2-1-2006
Abstract
Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte Carlo simulation and system-identification tools to determine whether a given circuit under test (CUT) is faulty. From the circuit description, and component tolerance specifications, the tolerance boxes of all circuit transfer-function coefficients are precomputed and used during the test. Using input/output signal information, the test procedure attempts to extract the CUT's transfer function. When this extraction is complete - if one or more of these measured transfer-function coefficients are found to be outside their tolerance boxes-the circuit is declared faulty. © 2006 IEEE.
Identifier
32044461556 (Scopus)
Publication Title
IEEE Transactions on Instrumentation and Measurement
External Full Text Location
https://doi.org/10.1109/TIM.2005.861490
ISSN
00189456
First Page
150
Last Page
157
Issue
1
Volume
55
Recommended Citation
Guo, Zhen and Savir, Jacob, "Coefficient-based test of parametric faults in analog circuits" (2006). Faculty Publications. 19059.
https://digitalcommons.njit.edu/fac_pubs/19059
