Characterization of gated silicon field emission micro triodes

Authors

D. Liu, Industrial Technology Research Institute of Taiwan
R. B. Marcus, New Jersey Institute of Technology

Document Type

Conference Proceeding

Publication Date

1-1-1993

Identifier

85068457866 (Scopus)

ISBN

[0780308522, 9780780308527]

Publication Title

Proceedings of IEEE 6th International Vacuum Microelectronics Conference IVMC 1993

External Full Text Location

https://doi.org/10.1109/IVMC.1993.700269

First Page

52

Last Page

53

Recommended Citation

Liu, D. and Marcus, R. B., "Characterization of gated silicon field emission micro triodes" (1993). Faculty Publications. 17120.
https://digitalcommons.njit.edu/fac_pubs/17120