RAM BIST

Document Type

Conference Proceeding

Publication Date

1-1-2000

Abstract

A RAM test scheme is described. The scheme can be used in both built-in mode and off-chip/module mode. Fault diagnosis is simple and never subjected to aliasing. Depending upon the test length, many kinds of failures can be detected, including stuck-cells, decoder faults, and shorts. Used in the built-in mode, the scheme does not slow down normal array operation and the hardware overhead is very low.

Identifier

0033722088 (Scopus)

Publication Title

Conference Record IEEE Instrumentation and Measurement Technology Conference

First Page

204

Last Page

211

Volume

1

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