Observer-based test of analog linear time-inv ariant circuits

Document Type

Conference Proceeding

Publication Date

1-1-2002

Abstract

Observer-based test methodolo gy is proposed in this paper for detecting parametric faults in analo g linear time- invariant circuits. A Kalman filter is used to reduce the mea- surement noise. Experiments conducte don an analog circuit are used to test the viability of the test methodology. The paper also discusses some inherent limitations of analog test in gener al. We show that, in the analo gtest domain, a fault-fr ee parameter may mask the detection of a faulty param- eter. Moreover, one faulty parameter may mask the detection of another faulty parameter leaving them both undetected.

Identifier

84931044222 (Scopus)

ISBN

[0769514537, 9780769514536]

Publication Title

Proceedings 1st IEEE International Workshop on Electronic Design Test and Applications Delta 2002

External Full Text Location

https://doi.org/10.1109/DELTA.2002.994581

First Page

13

Last Page

17

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