Structural studies of annealed ultrathin La0.8MnO3 films

Authors

Q. Qian, New Jersey Institute of Technology
T. A. Tyson, New Jersey Institute of Technology
C. Dubourdieu, Laboratoire des Matériaux et du Génie Physique (LMGP)
A. Bossak, Laboratoire des Matériaux et du Génie Physique (LMGP)
J. P. Sénateur, Laboratoire des Matériaux et du Génie Physique (LMGP)
M. Deleon, New Jersey Institute of Technology
J. Bai, Oak Ridge National Laboratory
G. Bonfait, Instituto Tecnológico E Nuclear

Document Type

Article

Publication Date

4-15-2002

Abstract

A detailed study of the long-range, nanoscale, and local structure of La0.8MnO3 films of varying thickness was performed. These measurements give insight on the relative volumes of the insulating and metallic regions. A thin metallic surface region is found in all films. The nature of the film growth is also discussed. © 2002 American Institute of Physics.

Identifier

79956015836 (Scopus)

Publication Title

Applied Physics Letters

External Full Text Location

https://doi.org/10.1063/1.1470689

ISSN

00036951

First Page

2663

Last Page

2665

Issue

15

Volume

80

Recommended Citation

Qian, Q.; Tyson, T. A.; Dubourdieu, C.; Bossak, A.; Sénateur, J. P.; Deleon, M.; Bai, J.; and Bonfait, G., "Structural studies of annealed ultrathin La0.8MnO3 films" (2002). Faculty Publications. 14704.
https://digitalcommons.njit.edu/fac_pubs/14704