Coefficient-based test of parametric faults in analog circuits

Document Type

Conference Proceeding

Publication Date

7-11-2003

Abstract

A coefficient-based test of parametric faults in analog circuits was discussed. The method was found to use pseudo Monte-Carlo simulation and system identification tools for determination of fault in given circuit under test (CUT). The analysis showed that the estimated time response and frequency and phase responses were close to the computed ones.

Identifier

0038170059 (Scopus)

Publication Title

Conference Record IEEE Instrumentation and Measurement Technology Conference

First Page

71

Last Page

75

Volume

1

This document is currently not available here.

Share

COinS