Influence of strain on the atomic and electronic structure of manganite films

Document Type

Article

Publication Date

3-1-2007

Abstract

A study of the long-range, local and electronic structure of Nd0.5Sr0.5MnO3 films of varying thickness between 500 and 2000 Å has been performed. Local structure measurements at the Sr K-edge reveal a reduction of the Mn-O-Mn bond angles in films below 1000 Å. Spin-polarized measurements reveal splitting of the Mn 3d eg state in the strained region of the films and are consistent with a two-layer model for thick films with a relaxed undistorted layer on top of a strained structurally distorted layer near the substrate. © 2007 Elsevier Ltd. All rights reserved.

Identifier

33847101908 (Scopus)

Publication Title

Journal of Physics and Chemistry of Solids

External Full Text Location

https://doi.org/10.1016/j.jpcs.2006.12.024

ISSN

00223697

First Page

458

Last Page

463

Issue

3

Volume

68

Grant

DMR-0209243

Fund Ref

National Science Foundation

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