Observation of strain and temperature induced changes in the band structure of thin La0.8MnO3-δ films

Document Type

Article

Publication Date

3-16-2007

Abstract

Mn K -edge resonant inelastic x-ray scattering measurements were performed on films of La0.8 Mn O3-δ. The measurements reveal that strain causes large shifts of the bands above the Fermi level. The Mn 3d band switches from a narrow upshifted peak at high temperature to a broad bulklike band at low temperature in ultrathin films. The strain induced switching behavior opens the possibility of tuning the transition to higher temperatures for device applications in this class of manganite materials. © 2007 American Institute of Physics.

Identifier

33947148811 (Scopus)

Publication Title

Applied Physics Letters

External Full Text Location

https://doi.org/10.1063/1.2711779

ISSN

00036951

Issue

10

Volume

90

Grant

DMR-0512196

Fund Ref

National Science Foundation

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