Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films

Document Type

Article

Publication Date

2-1-2008

Abstract

One of the central challenges of nanoscience is fabrication of nanoscale structures with well-controlled architectures using planar thin-film technology. Herein, we report that ordered nanocheckerboards in ZnMnGaO 4 films were grown epitaxially on single-crystal MgO substrates by utilizing a solid-state method of the phase separation-induced self-assembly. The films consist of two types of chemically distinct and regularly spaced nanorods with mutually coherent interfaces, ∼4 × 4 × 750 nm 3 in size and perfectly aligned along the film growth direction. Surprisingly, a significant in-plane strain, more than 2%, from the substrate is globally maintained over the entire film thickness of about 820 nm. The strain energy from Jahn-Teller distortions and the film-substrate lattice mismatch induce the coherent three-dimensional (3D) self-assembled nanostructure, relieving the volume strain energy while suppressing the formation of dislocations. © 2008 American Chemical Society.

Identifier

40449107943 (Scopus)

Publication Title

Nano Letters

External Full Text Location

https://doi.org/10.1021/nl072848s

ISSN

15306984

PubMed ID

18269259

First Page

720

Last Page

724

Issue

2

Volume

8

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