Micro- and nanoparticles self-assembly for virtually defect-free, adjustable monolayers

Document Type

Article

Publication Date

3-25-2008

Abstract

As chips further shrink toward smaller scales, fabrication processes based on the self-assembly of individual particles into patterns or structures are often sought. One of the most popular techniques for two-dimensional assembly (self-assembled monolayers) is based on capillary forces acting on particles placed at a liquid interface. Capillarity-induced clustering, however, has several limitations: it applies to relatively large (radius > ≈10 μm) particles only, the clustering is usually non-defect-free and lacks long-range order, and the lattice spacing cannot be adjusted. The goal of the present article is to show that these shortcomings can be addressed by using an external electric field normal to the interface. The resulting self-assembly is capable of controlling the lattice spacing statically or dynamically, forming virtually defect-free monolayers, and manipulating a broad range of particle sizes and types including nanoparticles and electrically neutral particles. © 2008 by The National Academy of Sciences of the USA.

Identifier

43449113671 (Scopus)

Publication Title

Proceedings of the National Academy of Sciences of the United States of America

External Full Text Location

https://doi.org/10.1073/pnas.0712392105

e-ISSN

10916490

ISSN

00278424

First Page

3711

Last Page

3714

Issue

10

Volume

105

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