Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction

Document Type

Article

Publication Date

10-27-2008

Abstract

The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume. © 2008 The American Physical Society.

Identifier

55449091486 (Scopus)

Publication Title

Physical Review B Condensed Matter and Materials Physics

External Full Text Location

https://doi.org/10.1103/PhysRevB.78.165424

e-ISSN

1550235X

ISSN

10980121

Issue

16

Volume

78

Grant

0225180

Fund Ref

National Science Foundation

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