Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield

Authors

John F. Federici, New Jersey Institute of Technology
Robert L. Wample, California State University, Fresno
David Rodriguez, New Jersey Institute of Technology
Suman Mukherjee, New Jersey Institute of Technology

Document Type

Article

Publication Date

3-1-2009

Abstract

The application of terahertz time-domain spectroscopy (THz-TDS) and imaging to differentiate flat and curved surfaces in reflection via the THz Gouy phase shift is demonstrated. For a THz-TDS system that is aligned for reflection from a flat surface, the presence of a curved surface displaces the image focal plane from the detector plane, resulting in a Gouy phase shift. The potential of utilizing this configuration for estimating the number and size of curved objects is discussed with particular emphasis on agriculture crop yield estimates. © 2009 Optical Society of America.

Identifier

63049132388 (Scopus)

Publication Title

Applied Optics

External Full Text Location

https://doi.org/10.1364/AO.48.001382

e-ISSN

15394522

ISSN

1559128X

First Page

1382

Last Page

1388

Issue

7

Volume

48

Recommended Citation

Federici, John F.; Wample, Robert L.; Rodriguez, David; and Mukherjee, Suman, "Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield" (2009). Faculty Publications. 12143.
https://digitalcommons.njit.edu/fac_pubs/12143