On the exploitation of narrow-width values for improving register file reliability
Document Type
Conference Proceeding
Publication Date
7-1-2009
Abstract
Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to soft errors induced by high-energy particle strikes. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. In this paper, we propose to exploit narrow-width register values, which present the majority of the generated values, for making a duplicate of the value within the same data item; this in-register duplication (IRD) eliminates the requirement for additional copy registers. The datapath pipeline is augmented to efficiently incorporate parity encoding and parity checking such that error recovery is seamlessly supported in IRD and the parity checking is overlapped with the execution stage to avoid increasing the critical path. A detailed architectural vulnerability factor (AVF) analysis shows that IRD significantly reduces the AVF from 8.4% in a conventional unprotected register file to 0.1% in an IRD register file. Our experimental evaluation using the SPEC CINT2000 benchmark suite also shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes, while only incurring a small power overhead. © 2006 IEEE.
Identifier
67651085335 (Scopus)
Publication Title
IEEE Transactions on Very Large Scale Integration VLSI Systems
External Full Text Location
https://doi.org/10.1109/TVLSI.2009.2017441
ISSN
10638210
First Page
953
Last Page
963
Issue
7
Volume
17
Recommended Citation
    Hu, Jie; Wang, Shuai; and Ziavras, Sotirios G., "On the exploitation of narrow-width values for improving register file reliability" (2009). Faculty Publications.  12037.
    
    
    
        https://digitalcommons.njit.edu/fac_pubs/12037
    
 
				 
					