Gate controlled negative differential resistance and photoconductivity enhancement in carbon nanotube addressable intra-connects
Document Type
Conference Proceeding
Publication Date
11-20-2009
Abstract
Field effect transistors were fabricated using carbon nanotube (CNT) intra-connnects. The intra-connects - individual tube or a small bundle of tubes spanning across the planar electrodes - were grown by using chemical vapor deposition (CVD) precisely between very sharp metal tips on the pre-fabricated electrodes. Gate-controlled N-shaped negative differential resistance (NDR) has been demonstrated. Enhanced differential photoconductance, which was associated with NDR was observed, as well. © 2009 Materials Research Society.
Identifier
70449598232 (Scopus)
Publication Title
Materials Research Society Symposium Proceedings
ISSN
02729172
First Page
173
Last Page
177
Volume
1142
Recommended Citation
Lee, Seon Woo; Rotkin, Slava; Sirenko, Andrei; Lopez, Daniel; Kornblit, Avi; and Grebel, Haim, "Gate controlled negative differential resistance and photoconductivity enhancement in carbon nanotube addressable intra-connects" (2009). Faculty Publications. 11850.
https://digitalcommons.njit.edu/fac_pubs/11850
