Investigation of structural and electronic properties of graphene oxide
Document Type
Article
Publication Date
7-4-2011
Abstract
The local atomic structure of graphene oxide has been probed using synchrotron radiations. Detailed investigations of recently proposed simplistic model of graphene oxide using x-ray absorption near edge spectroscopy have been performed. X-ray diffraction measurements and calculations indicate loss of coherence between graphene-like layers. However, larger in-plane structural coherence is understood to be present. Selected area electron diffraction measurements indicate the presence of graphitic regions in graphene oxide which is expected to produce interesting confinement effects in graphene oxide which could be important for the development of tunable electronic and photonic devices. © 2011 American Institute of Physics.
Identifier
79960540025 (Scopus)
Publication Title
Applied Physics Letters
External Full Text Location
https://doi.org/10.1063/1.3607305
ISSN
00036951
Issue
1
Volume
99
Grant
DMR 0512196
Fund Ref
National Science Foundation
Recommended Citation
Saxena, Sumit; Tyson, Trevor A.; Shukla, Shobha; Negusse, Ezana; Chen, Haiyan; and Bai, Jianming, "Investigation of structural and electronic properties of graphene oxide" (2011). Faculty Publications. 11279.
https://digitalcommons.njit.edu/fac_pubs/11279
