Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol-gel silica films
Document Type
Article
Publication Date
8-10-2011
Abstract
Room-temperature 1535 nm band photoluminescence in ∼126 nm silica films (6 at% doping), produced by spin coating an Er2O3 and tetraethylorthosilicate sol-gel formulation on silicon substrates, was studied as a function of vacuum furnace annealing (500-1050 °C). Emission is strongly enhanced for annealing near 850 °C, which is shown by modelling the temperature dependence as arising from thermally activated removal of hydroxyl ions. Suitability of such a process for silicon-based applications is discussed. © 2011 IOP Publishing Ltd.
Identifier
79960862560 (Scopus)
Publication Title
Journal of Physics D Applied Physics
External Full Text Location
https://doi.org/10.1088/0022-3727/44/31/315401
e-ISSN
13616463
ISSN
00223727
Issue
31
Volume
44
Recommended Citation
Abedrabbo, S.; Lahlouh, B.; and Fiory, A. T., "Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol-gel silica films" (2011). Faculty Publications. 11226.
https://digitalcommons.njit.edu/fac_pubs/11226
