Document Type
Thesis
Date of Award
Fall 1-31-1994
Degree Name
Master of Science in Applied Physics - (M.S.)
Department
Physics
First Advisor
Ken K. Chin
Second Advisor
John Charles Hensel
Third Advisor
Halina Opyrchal
Abstract
The photoluminescence produced by four MOCVD grown epitaxial thin film samples was studied to give insight into sample quality. The four samples under this study were GaAs on a GaAs substrate, Al.25Ga.75As on a GaAs substrate, Al.30Ga.7OAs on a GaAs substrate, and GaSb on a GaSb substrate. Excitation was achieved through the use of the 514.0 nm line of an argon ion laser, and sample cooling was attained by use of a cryostat cooler using helium gas to attain a low temperature limit of 10°K. The GaAs and Al.30Ga.7OAs samples exhibited typical spectra for MOCVD grown samples produced by other sources in the widths of the resulting BE peaks and in the characterisitics, of their acceptor-induced transitions. The narrow, prominent BE peaks of the Al.25Ga.75As and GaSb samples had shown them to be of exceptional quality.
Recommended Citation
Koons, John Mark, "Photoluminescence study of gallium arsenide, aluminum gallium arsenide, and gallium antimonide thin films grown by metalorganic chemical vapor deposition" (1994). Theses. 1216.
https://digitalcommons.njit.edu/theses/1216
