Analog Circuit Test Using Transfer Function Coefficient Estimates
Document Type
Conference Proceeding
Publication Date
1-1-2004
Abstract
Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.
Identifier
1642336783 (Scopus)
Publication Title
IEICE Transactions on Information and Systems
ISSN
09168532
First Page
642
Last Page
646
Issue
3
Volume
E87-D
Recommended Citation
Guo, Zhen and Savir, Jacob, "Analog Circuit Test Using Transfer Function Coefficient Estimates" (2004). Faculty Publications. 20524.
https://digitalcommons.njit.edu/fac_pubs/20524
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