Determining thickness independently from optical constants using ultrafast spectral interferometry
Document Type
Conference Proceeding
Publication Date
1-1-2005
Abstract
We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.
Identifier
84899134531 (Scopus)
ISBN
[1557527709, 9781557527707]
Publication Title
Optics Infobase Conference Papers
e-ISSN
21622701
Recommended Citation
Huang, Feng; Federici, John F.; Gary, Dale; Jedju, Thomas; and Warren, Warren S., "Determining thickness independently from optical constants using ultrafast spectral interferometry" (2005). Faculty Publications. 19853.
https://digitalcommons.njit.edu/fac_pubs/19853
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