Optical properties of Stranski-Krastanov grown three-dimensional Si/Si 1-xGex nanostructures
Document Type
Conference Proceeding
Publication Date
2-1-2005
Abstract
Detailed Raman and photoluminescence (PL) measurements are reported for Si/Si1-xGex nanostructures grown by molecular beam epitaxy under near Stranski-Krastanov (S-K) growth mode conditions. In samples with x ranging from 0.096 to 0.53, we observe that an increase in the Raman signal related to Ge-Ge vibrations correlates with (i) a red shift in the PL peak position, (ii) an increase in the activation energy of PL thermal quenching, and (iii) an increase in the PL quantum efficiency. The results indicate that for x>0.5 Ge atoms form nanometer size clusters with a nearly pure Ge core surrounded by a SiGe shell. Time-resolved PL measurements reveal a stretched-exponential long-lived PL component that is associated with compositional and dimensional fluctuations in the SiGe dots. © 2004 Elsevier B.V. All rights reserved.
Identifier
13544263324 (Scopus)
Publication Title
Physica E Low Dimensional Systems and Nanostructures
External Full Text Location
https://doi.org/10.1016/j.physe.2004.08.047
ISSN
13869477
First Page
174
Last Page
179
Issue
1-4
Volume
26
Fund Ref
National Science Foundation
Recommended Citation
Kamenev, B. V.; Baribeau, J. M.; Lockwood, D. J.; and Tsybeskov, L., "Optical properties of Stranski-Krastanov grown three-dimensional Si/Si 1-xGex nanostructures" (2005). Faculty Publications. 19797.
https://digitalcommons.njit.edu/fac_pubs/19797
