Determining thickness independently from optical constants using ultrafast spectral interferometry
Document Type
Conference Proceeding
Publication Date
12-1-2005
Abstract
We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.
Identifier
30944460721 (Scopus)
ISBN
[1557527954, 9781557527950]
Publication Title
2005 Conference on Lasers and Electro Optics CLEO
First Page
1103
Last Page
1105
Volume
2
Recommended Citation
Huang, Feng; Federici, John F.; Gary, Dale; Jedju, Thomas; and Warren, Warren S., "Determining thickness independently from optical constants using ultrafast spectral interferometry" (2005). Faculty Publications. 19405.
https://digitalcommons.njit.edu/fac_pubs/19405
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