In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration

Authors

H. Grebel, Newark College of Engineering
B. Iskandar, Newark College of Engineering
P. Pien, Newark College of Engineering
K. Sheppard, Charles V. Schaefer, Jr. School of Engineering and Science

Document Type

Article

Publication Date

12-1-1990

Abstract

On-line, first-order light diffraction from a laser-induced etched grating in a thin-film cell configuration is investigated. It is suggested that a layer of dissolved reaction products interferes with the in situ light scattering measurements.

Identifier

0001060623 (Scopus)

Publication Title

Applied Physics Letters

External Full Text Location

https://doi.org/10.1063/1.103739

ISSN

00036951

First Page

2959

Last Page

2961

Issue

27

Volume

57

Recommended Citation

Grebel, H.; Iskandar, B.; Pien, P.; and Sheppard, K., "In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration" (1990). Faculty Publications. 17708.
https://digitalcommons.njit.edu/fac_pubs/17708