Reliability prediction of solid dielectrics using electrial noise as a screening parameter

Authors

Raj Misra, New Jersey Institute of Technology
Shyam Pandey, New Jersey Institute of Technology
Vinu Sundaresan, New Jersey Institute of Technology

Document Type

Article

Publication Date

1-1-1991

Abstract

Conclusions - This paper reports the use of electrical noise for the screening of dielectric sheet material for reliability. Results indicate that high-noise units have a greater failure rate compared to low noise units when subjected to identical voltage and temperature stresses. Solid dielectric sheet materials and small transformers were tested. Measurement of electrical noise in a dielectric will be useful in reliability screening and preventive maintenance.The problem to be solved in a given machine or component, is how to probe for the noise that may be generated at a given spot and then locate that spot precisely. © 1991 IEEE

Identifier

0026135789 (Scopus)

Publication Title

IEEE Transactions on Reliability

External Full Text Location

https://doi.org/10.1109/24.75346

e-ISSN

15581721

ISSN

00189529

First Page

113

Last Page

116

Issue

1

Volume

40

Recommended Citation

Misra, Raj; Pandey, Shyam; and Sundaresan, Vinu, "Reliability prediction of solid dielectrics using electrial noise as a screening parameter" (1991). Faculty Publications. 17554.
https://digitalcommons.njit.edu/fac_pubs/17554