A high resolution interferometer for use with synchrotron radiation
Document Type
Article
Publication Date
8-1-1992
Abstract
We present the first results from a new instrument which is designed to work at very high resolution in the infrared spectral region but whose principles can be used in the VUV/soft-X-ray region. The instrument is based on an interferometer. For the VUV/soft-X-ray region the beamsplitting is achieved by wavefront division which takes advantage of the spatial coherence of synchrotron radiation. Normally the highest frequency in the spectrum from an interferometer is determined by the sampling frequency, which has to be at least twice that of the highest frequency in the spectrum. We show that this can be avoided if the spectral range is deliberately restricted by a grating or by the use of an undulator. In this case the interferograms contain a known and restricted range of frequencies which lead to an unambiguous assignment during the Fourier processing required to generate the spectrum. © 1992.
Identifier
44049121348 (Scopus)
Publication Title
Nuclear Inst and Methods in Physics Research A
External Full Text Location
https://doi.org/10.1016/0168-9002(92)90582-O
ISSN
01689002
First Page
384
Last Page
386
Issue
1-3
Volume
319
Grant
DE-AC02-76CH00016
Recommended Citation
Moeller, K. D.; Sears, T.; Liu, H. T.; Hirschmugl, C. J.; and Williams, G. P., "A high resolution interferometer for use with synchrotron radiation" (1992). Faculty Publications. 17293.
https://digitalcommons.njit.edu/fac_pubs/17293
