Simulation Techniques for the Manufacturing Test of MCMs

Document Type

Article

Publication Date

1-1-1997

Abstract

Simulation techniques used in the Manufacturing Test SIMulator (MTSIM) are described. MTSIM is a Concurrent Engineering tool used to simulate the manufacturing test and repair aspects of boards and MCMs from design concept through manufacturing release. MTSIM helps designers select assembly process, specify Design For Test (DFT) features, select board test coverage, specify ASIC defect level goals, establish product feasibility, and predict manufacturing quality and cost goals. A new yield model for boards and MCMs which accounts for the clustering of solder defects is introduced and used to predict the yield at each test step. In addition, MTSIM estimates the average number of defects per board detected at each test step, and estimates costs incurred in test execution, fault isolation and repair. MTSIM models were validated with high performance assemblies at Hewlett-Packard (HP).

Identifier

0031073274 (Scopus)

Publication Title

Journal of Electronic Testing Theory and Applications JETTA

External Full Text Location

https://doi.org/10.1023/a:1008286901817

ISSN

09238174

First Page

137

Last Page

149

Issue

1-2

Volume

10

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